| http://dbpedia.org/ontology/abstract
|
반도체 오류 진단 및 분석은 스캔 기반의 장치들의 오작동이나 고장의 원인이 되는 회로를 찾아내는 예측 알고리즘이다.
, Semiconductor fault diagnostics are predictive software algorithms which are used to refine and localize the circuitry responsible for the failure of scan-based devices.
|
| http://dbpedia.org/ontology/wikiPageID
|
8773247
|
| http://dbpedia.org/ontology/wikiPageLength
|
2336
|
| http://dbpedia.org/ontology/wikiPageRevisionID
|
1000141621
|
| http://dbpedia.org/ontology/wikiPageWikiLink
|
http://dbpedia.org/resource/Short_circuit +
, http://dbpedia.org/resource/Software +
, http://dbpedia.org/resource/Open-circuit_voltage +
, http://dbpedia.org/resource/Category:Semiconductor_analysis +
, http://dbpedia.org/resource/Semiconductor +
, http://dbpedia.org/resource/Failure_analysis +
, http://dbpedia.org/resource/Electrical_circuit +
|
| http://dbpedia.org/property/wikiPageUsesTemplate
|
http://dbpedia.org/resource/Template:Reflist +
, http://dbpedia.org/resource/Template:Tech-stub +
, http://dbpedia.org/resource/Template:Cite_book +
|
| http://purl.org/dc/terms/subject
|
http://dbpedia.org/resource/Category:Semiconductor_analysis +
|
| http://purl.org/linguistics/gold/hypernym
|
http://dbpedia.org/resource/Algorithms +
|
| http://www.w3.org/ns/prov#wasDerivedFrom
|
http://en.wikipedia.org/wiki/Semiconductor_fault_diagnostics?oldid=1000141621&ns=0 +
|
| http://xmlns.com/foaf/0.1/isPrimaryTopicOf
|
http://en.wikipedia.org/wiki/Semiconductor_fault_diagnostics +
|
| owl:sameAs |
http://rdf.freebase.com/ns/m.027j71n +
, http://www.wikidata.org/entity/Q7449394 +
, https://global.dbpedia.org/id/4uqdH +
, http://ko.dbpedia.org/resource/%EB%B0%98%EB%8F%84%EC%B2%B4_%EC%98%A4%EB%A5%98_%EC%A7%84%EB%8B%A8_%EB%B0%8F_%EB%B6%84%EC%84%9D +
, http://dbpedia.org/resource/Semiconductor_fault_diagnostics +
|
| rdfs:comment |
반도체 오류 진단 및 분석은 스캔 기반의 장치들의 오작동이나 고장의 원인이 되는 회로를 찾아내는 예측 알고리즘이다.
, Semiconductor fault diagnostics are predictive software algorithms which are used to refine and localize the circuitry responsible for the failure of scan-based devices.
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| rdfs:label |
Semiconductor fault diagnostics
, 반도체 오류 진단 및 분석
|
