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https://dblp.org/rec/journals/mr/KimLKSL18

https://dblp.org/rdf/schema#authoredBy	https://dblp.org/pid/138/9060 + , https://dblp.org/pid/179/5537 + , https://dblp.org/pid/146/1566 + , https://dblp.org/pid/89/8532 + , https://dblp.org/pid/227/9311 +
https://dblp.org/rdf/schema#bibtexType	http://purl.org/net/nknouf/ns/bibtex#Article +
https://dblp.org/rdf/schema#documentPage	https://doi.org/10.1016/J.MICROREL.2018.06.117 +
https://dblp.org/rdf/schema#doi	https://doi.org/10.1016/J.MICROREL.2018.06.117 + , http://dx.doi.org/10.1016/J.MICROREL.2018.06.117 +
https://dblp.org/rdf/schema#listedOnTocPage	https://dblp.org/db/journals/mr/mr88 +
https://dblp.org/rdf/schema#numberOfCreators	5
https://dblp.org/rdf/schema#pagination	179-182
https://dblp.org/rdf/schema#primaryDocumentPage	https://doi.org/10.1016/J.MICROREL.2018.06.117 +
https://dblp.org/rdf/schema#publishedIn	Microelectron. Reliab.
https://dblp.org/rdf/schema#publishedInJournal	Microelectron. Reliab.
https://dblp.org/rdf/schema#publishedInJournalVolume	88-90
https://dblp.org/rdf/schema#title	Effect of DC/AC stress on the reliability of cell capacitor in DRAM.
https://dblp.org/rdf/schema#yearOfPublication	2018
owl:sameAs	https://doi.org/10.1016/J.MICROREL.2018.06.117 + , http://dx.doi.org/10.1016/J.MICROREL.2018.06.117 +
rdf:type	https://dblp.org/rdf/schema#Publication + , https://dblp.org/rdf/schema#Article +
rdfs:label	Gang-Jun Kim et al.: Effect of DC/AC stress on the reliability of cell capacitor in DRAM. (2018)

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