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https://dblp.org/pid/121/9129 +
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http://purl.org/net/nknouf/ns/bibtex#Article +
|
| https://dblp.org/rdf/schema#createdBy
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https://dblp.org/pid/121/9129 +
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| https://dblp.org/rdf/schema#documentPage
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https://doi.org/10.1016/J.MICROREL.2018.07.107 +
|
| https://dblp.org/rdf/schema#doi
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https://doi.org/10.1016/J.MICROREL.2018.07.107 +
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https://dblp.org/db/journals/mr/mr88 +
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6
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| https://dblp.org/rdf/schema#pagination
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48-53
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https://doi.org/10.1016/J.MICROREL.2018.07.107 +
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Microelectron. Reliab.
|
| https://dblp.org/rdf/schema#publishedInJournal
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Microelectron. Reliab.
|
| https://dblp.org/rdf/schema#publishedInJournalVolume
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88-90
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| https://dblp.org/rdf/schema#publishedInStream
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https://dblp.org/streams/journals/mr +
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| https://dblp.org/rdf/schema#title
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A novel crowdsourcing platform for microelectronics counterfeit defect detection.
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2018
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https://doi.org/10.1016/J.MICROREL.2018.07.107 +
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Bahar Ahmadi et al.: A novel crowdsourcing platform for microelectronics counterfeit defect detection. (2018)
|
