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Https://dblp.org/rec/journals/jsa/ZhaiAEHHGM15
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https://dblp.org/rec/journals/jsa/ZhaiAEHHGM15
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https://dblp.org/rdf/schema#documentPage https://doi.org/10.1016/J.SYSARC.2015.07.007 +
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https://dblp.org/rdf/schema#publishedIn J. Syst. Archit.
https://dblp.org/rdf/schema#publishedInJournal J. Syst. Archit.
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https://dblp.org/rdf/schema#title Exploring ICMetrics to detect abnormal program behaviour on embedded devices.
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rdfs:label Xiaojun Zhai et al.: Exploring ICMetrics to detect abnormal program behaviour on embedded devices. (2015)
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