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https://dblp.org/pid/70/9455 +
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https://dblp.org/rdf/schema#bibtexType
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http://purl.org/net/nknouf/ns/bibtex#Article +
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https://dblp.org/rdf/schema#createdBy
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https://dblp.org/pid/70/9455 +
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https://dblp.org/rdf/schema#documentPage
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https://doi.org/10.1016/J.SYSARC.2015.07.007 +
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https://dblp.org/rdf/schema#doi
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https://doi.org/10.1016/J.SYSARC.2015.07.007 +
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https://dblp.org/rdf/schema#listedOnTocPage
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https://dblp.org/db/journals/jsa/jsa61 +
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https://dblp.org/rdf/schema#numberOfCreators
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7
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https://dblp.org/rdf/schema#pagination
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567-575
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https://dblp.org/rdf/schema#primaryDocumentPage
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https://doi.org/10.1016/J.SYSARC.2015.07.007 +
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https://dblp.org/rdf/schema#publishedIn
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J. Syst. Archit.
|
https://dblp.org/rdf/schema#publishedInJournal
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J. Syst. Archit.
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https://dblp.org/rdf/schema#publishedInJournalVolume
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61
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https://dblp.org/rdf/schema#publishedInJournalVolumeIssue
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10
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https://dblp.org/rdf/schema#publishedInStream
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https://dblp.org/streams/journals/jsa +
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https://dblp.org/rdf/schema#title
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Exploring ICMetrics to detect abnormal program behaviour on embedded devices.
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https://dblp.org/rdf/schema#wikidata
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http://www.wikidata.org/entity/Q58487281 +
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https://dblp.org/rdf/schema#yearOfPublication
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2015
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owl:sameAs |
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rdf:type |
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rdfs:label |
Xiaojun Zhai et al.: Exploring ICMetrics to detect abnormal program behaviour on embedded devices. (2015)
|