| https://dblp.org/rdf/schema#authoredBy
|
https://dblp.org/pid/48/1982 +
, https://dblp.org/pid/83/5151 +
, https://dblp.org/pid/75/5723 +
, https://dblp.org/pid/46/2311-12 +
, https://dblp.org/pid/284/8639-3 +
, https://dblp.org/pid/52/323 +
, https://dblp.org/pid/136/1371 +
, https://dblp.org/pid/03/8513 +
, https://dblp.org/pid/84/8525 +
, https://dblp.org/pid/89/5152 +
|
| https://dblp.org/rdf/schema#bibtexType
|
http://purl.org/net/nknouf/ns/bibtex#Article +
|
| https://dblp.org/rdf/schema#documentPage
|
https://doi.org/10.1587/ELEX.14.20160901 +
|
| https://dblp.org/rdf/schema#doi
|
https://doi.org/10.1587/ELEX.14.20160901 +
, http://dx.doi.org/10.1587/ELEX.14.20160901 +
|
| https://dblp.org/rdf/schema#listedOnTocPage
|
https://dblp.org/db/journals/ieiceee/ieiceee14 +
|
| https://dblp.org/rdf/schema#numberOfCreators
|
10
|
| https://dblp.org/rdf/schema#pagination
|
20160901
|
| https://dblp.org/rdf/schema#primaryDocumentPage
|
https://doi.org/10.1587/ELEX.14.20160901 +
|
| https://dblp.org/rdf/schema#publishedIn
|
IEICE Electron. Express
|
| https://dblp.org/rdf/schema#publishedInJournal
|
IEICE Electron. Express
|
| https://dblp.org/rdf/schema#publishedInJournalVolume
|
14
|
| https://dblp.org/rdf/schema#publishedInJournalVolumeIssue
|
2
|
| https://dblp.org/rdf/schema#title
|
Enhanced 3 × VDD-tolerant ESD clamp circuit with stacked configuration.
|
| https://dblp.org/rdf/schema#yearOfPublication
|
2017
|
| owl:sameAs |
https://doi.org/10.1587/ELEX.14.20160901 +
, http://dx.doi.org/10.1587/ELEX.14.20160901 +
|
| rdf:type |
https://dblp.org/rdf/schema#Publication +
, https://dblp.org/rdf/schema#Article +
|
| rdfs:label |
Xiaoyun Li et al.: Enhanced 3 × VDD-tolerant ESD clamp circuit with stacked configuration. (2017)
|
