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Scanning Hall probe microscope (SHPM) is a … Scanning Hall probe microscope (SHPM) is a variety of a scanning probe microscope which incorporates accurate sample approach and positioning of the scanning tunnelling microscope with a semiconductor Hall sensor. Developed in 1996 by Oral, Bending and Henini, SHPM allows mapping the magnetic induction associated with a sample. Current state of the art SHPM systems utilize 2D electron gas materials (e.g. GaAs/AlGaAs) to provide high spatial resolution (~300 nm) imaging with high magnetic field sensitivity. Unlike the magnetic force microscope the SHPM provides direct quantitative information on the magnetic state of a material. The SHPM can also image magnetic induction under applied fields up to ~1 tesla and over a wide range of temperatures (millikelvins to 300 K). The SHPM can be used to image many types of magnetic structures such as thin films, permanent magnets, MEMS structures, current carrying traces on PCBs, permalloy disks, and recording mediaPCBs, permalloy disks, and recording media
, 走査型ホール素子顕微鏡（そうさがたホールそしけんびきょう、Scanning Hall Probe Microscopy : SHPM）は走査型プローブ顕微鏡の一種。
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走査型ホール素子顕微鏡（そうさがたホールそしけんびきょう、Scanning Hall Probe Microscopy : SHPM）は走査型プローブ顕微鏡の一種。
, Scanning Hall probe microscope (SHPM) is a … Scanning Hall probe microscope (SHPM) is a variety of a scanning probe microscope which incorporates accurate sample approach and positioning of the scanning tunnelling microscope with a semiconductor Hall sensor. Developed in 1996 by Oral, Bending and Henini, SHPM allows mapping the magnetic induction associated with a sample. Current state of the art SHPM systems utilize 2D electron gas materials (e.g. GaAs/AlGaAs) to provide high spatial resolution (~300 nm) imaging with high magnetic field sensitivity. Unlike the magnetic force microscope the SHPM provides direct quantitative information on the magnetic state of a material. The SHPM can also image magnetic induction under applied fields up to ~1 tesla and over a wide range of temperatures (millikelvins to 300 K).e of temperatures (millikelvins to 300 K).
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走査型ホール素子顕微鏡
, Scanning Hall probe microscope
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