| http://dbpedia.org/ontology/abstract
|
Pictometry International is an aerial meas … Pictometry International is an aerial measurement company based in Henrietta, New York that develops software that uses three-dimensional aerial photographs to view high-resolution images of buildings in their entirety. Pictometry International's technology was developed at the Rochester Institute of Technology and shows structures at an oblique angle or at a 45-degree angle, from all sides providing perspective and overhead shot images that are accurate to 1/100th of an inch. The company has 80 Cessnas that provide high-resolution aerial photography in counties that include 95 percent of the U.S. population. The company was ranked fifth on the Rochester Top 100 companies list in 2011. Pictometry International along with BLOM ASA and Fugro EarthData, Inc. accounted for approximately a quarter of the global aerial imaging market revenue in 2013. In 2013, Pictometry International merged with EagleView Technologies, an aerial roof and wall measurement company making EagleView Technology Corp the parent company.leView Technology Corp the parent company.
|
| http://dbpedia.org/ontology/foundingYear
|
2000
|
| http://dbpedia.org/ontology/numberOfEmployees
|
300
|
| http://dbpedia.org/ontology/product
|
http://dbpedia.org/resource/Orthophoto +
|
| http://dbpedia.org/ontology/thumbnail
|
http://commons.wikimedia.org/wiki/Special:FilePath/Pictometry_headquarters.jpg?width=300 +
|
| http://dbpedia.org/ontology/type
|
http://dbpedia.org/resource/Subsidiary +
|
| http://dbpedia.org/ontology/wikiPageID
|
3710051
|
| http://dbpedia.org/ontology/wikiPageLength
|
9712
|
| http://dbpedia.org/ontology/wikiPageRevisionID
|
1106545269
|
| http://dbpedia.org/ontology/wikiPageWikiLink
|
http://dbpedia.org/resource/Subsidiary +
, http://dbpedia.org/resource/Category:2013_mergers_and_acquisitions +
, http://dbpedia.org/resource/Henrietta%2C_New_York +
, http://dbpedia.org/resource/Rochester_Institute_of_Technology +
, http://dbpedia.org/resource/Microsoft +
, http://dbpedia.org/resource/Geospatial_analysis +
, http://dbpedia.org/resource/Photogrammetry +
, http://dbpedia.org/resource/Category:Companies_based_in_Monroe_County%2C_New_York +
, http://dbpedia.org/resource/Bothell%2C_Washington +
, http://dbpedia.org/resource/Rochester_Top_100 +
, http://dbpedia.org/resource/National_Geographic_%28magazine%29 +
, http://dbpedia.org/resource/Angle +
, http://dbpedia.org/resource/File:Pictometry_headquarters.JPG +
, http://dbpedia.org/resource/Orthophoto +
, http://dbpedia.org/resource/Southampton%2C_New_York +
, http://dbpedia.org/resource/Algorithm +
, http://dbpedia.org/resource/Bing_Maps_Platform +
, http://dbpedia.org/resource/Category:Companies_established_in_2000 +
, http://dbpedia.org/resource/Category:Photography_companies_of_the_United_States +
, http://dbpedia.org/resource/Aerial_photography +
, http://dbpedia.org/resource/Cessna +
, http://dbpedia.org/resource/Image_resolution +
, http://dbpedia.org/resource/EagleView_Technologies +
|
| http://dbpedia.org/property/areaServed
|
Worldwide
|
| http://dbpedia.org/property/founder
|
Stephen L. Schultz
|
| http://dbpedia.org/property/industry
|
Commercial services
|
| http://dbpedia.org/property/keyPeople
|
Rishi Daga
|
| http://dbpedia.org/property/locationCity
|
Henrietta, New York, U.S.
|
| http://dbpedia.org/property/name
|
Pictometry International
|
| http://dbpedia.org/property/numEmployees
|
300
|
| http://dbpedia.org/property/parent
|
EagleView Technology Corp
|
| http://dbpedia.org/property/products
|
Geo-referenced aerial image libraries
, LiDAR remote sensing
, oblique
, street view
, inside imagery
, 3
, orthophotography
, imaging software
|
| http://dbpedia.org/property/services
|
analytics
, deployment
, Imagery
|
| http://dbpedia.org/property/type
|
http://dbpedia.org/resource/Subsidiary +
|
| http://dbpedia.org/property/wikiPageUsesTemplate
|
http://dbpedia.org/resource/Template:Reflist +
, http://dbpedia.org/resource/Template:Start_date_and_age +
, http://dbpedia.org/resource/Template:URL +
, http://dbpedia.org/resource/Template:Infobox_company +
|
| http://purl.org/dc/terms/subject
|
http://dbpedia.org/resource/Category:Companies_established_in_2000 +
, http://dbpedia.org/resource/Category:2013_mergers_and_acquisitions +
, http://dbpedia.org/resource/Category:Companies_based_in_Monroe_County%2C_New_York +
, http://dbpedia.org/resource/Category:Photography_companies_of_the_United_States +
|
| http://purl.org/linguistics/gold/hypernym
|
http://dbpedia.org/resource/Company +
|
| http://www.w3.org/ns/prov#wasDerivedFrom
|
http://en.wikipedia.org/wiki/Pictometry_International?oldid=1106545269&ns=0 +
|
| http://xmlns.com/foaf/0.1/depiction
|
http://commons.wikimedia.org/wiki/Special:FilePath/Pictometry_headquarters.jpg +
|
| http://xmlns.com/foaf/0.1/isPrimaryTopicOf
|
http://en.wikipedia.org/wiki/Pictometry_International +
|
| http://xmlns.com/foaf/0.1/name
|
Pictometry International
|
| owl:sameAs |
http://www.wikidata.org/entity/Q7191102 +
, http://dbpedia.org/resource/Pictometry_International +
, http://yago-knowledge.org/resource/Pictometry_International +
, http://rdf.freebase.com/ns/m.0h1c0gw +
, https://global.dbpedia.org/id/4u9pg +
|
| rdf:type |
http://dbpedia.org/class/yago/Organization108008335 +
, http://www.wikidata.org/entity/Q24229398 +
, http://dbpedia.org/ontology/Organisation +
, http://dbpedia.org/ontology/Company +
, http://dbpedia.org/class/yago/WikicatCompaniesBasedInMonroeCounty%2CNewYork +
, http://dbpedia.org/class/yago/YagoPermanentlyLocatedEntity +
, http://dbpedia.org/class/yago/Abstraction100002137 +
, http://dbpedia.org/class/yago/Institution108053576 +
, http://dbpedia.org/class/yago/WikicatPhotographyCompaniesOfTheUnitedStates +
, http://dbpedia.org/class/yago/SocialGroup107950920 +
, http://dbpedia.org/class/yago/Company108058098 +
, http://dbpedia.org/ontology/Agent +
, http://dbpedia.org/class/yago/YagoLegalActorGeo +
, http://dbpedia.org/class/yago/YagoLegalActor +
, http://www.wikidata.org/entity/Q4830453 +
, http://www.wikidata.org/entity/Q43229 +
, http://schema.org/Organization +
, http://dbpedia.org/class/yago/WikicatCompaniesEstablishedIn2000 +
, http://www.ontologydesignpatterns.org/ont/dul/DUL.owl#SocialPerson +
, http://dbpedia.org/class/yago/Group100031264 +
, http://www.ontologydesignpatterns.org/ont/dul/DUL.owl#Agent +
|
| rdfs:comment |
Pictometry International is an aerial meas … Pictometry International is an aerial measurement company based in Henrietta, New York that develops software that uses three-dimensional aerial photographs to view high-resolution images of buildings in their entirety. Pictometry International's technology was developed at the Rochester Institute of Technology and shows structures at an oblique angle or at a 45-degree angle, from all sides providing perspective and overhead shot images that are accurate to 1/100th of an inch. The company has 80 Cessnas that provide high-resolution aerial photography in counties that include 95 percent of the U.S. population.include 95 percent of the U.S. population.
|
| rdfs:label |
Pictometry International
|
