| http://dbpedia.org/ontology/abstract
|
A stress test (sometimes called a torture … A stress test (sometimes called a torture test) of hardware is a form of deliberately intense and thorough testing used to determine the stability of a given system or entity. It involves testing beyond normal operational capacity, often to a breaking point, in order to observe the results. Reasons can include: to determine breaking points and safe usage limits; to confirm that the intended specifications are being met; to determine modes of failure (how exactly a system may fail), and to test stable operation of a part or system outside standard usage. Reliability engineers often test items under expected stress or even under accelerated stress in order to determine the operating life of the item or to determine modes of failure. The term stress test as it relates to hardware (including electronics, physical devices, nuclear power plants, etc.) is likely to have different refined meanings in specific contexts. One example is in materials, see Fatigue (material).e is in materials, see Fatigue (material).
, Teste de massa é usado para verificar o li … Teste de massa é usado para verificar o limite de dados processados pelo software até que ele não consiga mais processa-lo. Também é conhecido como teste de estresse. Usado para validar e avaliar a aceitabilidade dos limites operacionais de um sistema de acordo com cargas de trabalho variáveis, ao passo que o sistema em teste permanece constante. Em geral, as medições são tomadas com base na taxa de transferência de dados da carga de trabalho e no tempo de resposta da transação alinhado.o tempo de resposta da transação alinhado.
|
| http://dbpedia.org/ontology/wikiPageID
|
38628314
|
| http://dbpedia.org/ontology/wikiPageLength
|
6576
|
| http://dbpedia.org/ontology/wikiPageRevisionID
|
1055531605
|
| http://dbpedia.org/ontology/wikiPageWikiLink
|
http://dbpedia.org/resource/Folding@home +
, http://dbpedia.org/resource/Crash_%28computing%29 +
, http://dbpedia.org/resource/Destructive_testing +
, http://dbpedia.org/resource/Black_box_testing +
, http://dbpedia.org/resource/Instruction_%28computer_science%29 +
, http://dbpedia.org/resource/Prime95 +
, http://dbpedia.org/resource/Undervolting +
, http://dbpedia.org/resource/Reliability_engineering +
, http://dbpedia.org/resource/Category:Environmental_testing +
, http://dbpedia.org/resource/Load_testing +
, http://dbpedia.org/resource/Temperature +
, http://dbpedia.org/resource/ASUS +
, http://dbpedia.org/resource/Failure_causes +
, http://dbpedia.org/resource/Stress_test_%28disambiguation%29 +
, http://dbpedia.org/resource/Central_processing_unit +
, http://dbpedia.org/resource/Sandy_Bridge +
, http://dbpedia.org/resource/Overvolting +
, http://dbpedia.org/resource/Burn-in +
, http://dbpedia.org/resource/CPU_core_voltage +
, http://dbpedia.org/resource/Distributed_computing +
, http://dbpedia.org/resource/Highly_Accelerated_Life_Test +
, http://dbpedia.org/resource/Load_%28computing%29 +
, http://dbpedia.org/resource/Overclocking +
, http://dbpedia.org/resource/Intel +
, http://dbpedia.org/resource/Humidity +
, http://dbpedia.org/resource/Underclocking +
, http://dbpedia.org/resource/Load_and_performance_test_tools +
, http://dbpedia.org/resource/Fatigue_%28material%29 +
, http://dbpedia.org/resource/Computer_hardware +
, http://dbpedia.org/resource/Benchmark_%28computing%29 +
, http://dbpedia.org/resource/Clock_rate +
, http://dbpedia.org/resource/Category:Hardware_testing +
, http://dbpedia.org/resource/Stress_testing_%28software%29 +
, http://dbpedia.org/resource/Hang_%28computing%29 +
, http://dbpedia.org/resource/X79 +
|
| http://dbpedia.org/property/wikiPageUsesTemplate
|
http://dbpedia.org/resource/Template:Short_description +
, http://dbpedia.org/resource/Template:Reflist +
|
| http://purl.org/dc/terms/subject
|
http://dbpedia.org/resource/Category:Hardware_testing +
, http://dbpedia.org/resource/Category:Environmental_testing +
|
| http://purl.org/linguistics/gold/hypernym
|
http://dbpedia.org/resource/Form +
|
| http://www.w3.org/ns/prov#wasDerivedFrom
|
http://en.wikipedia.org/wiki/Hardware_stress_test?oldid=1055531605&ns=0 +
|
| http://xmlns.com/foaf/0.1/isPrimaryTopicOf
|
http://en.wikipedia.org/wiki/Hardware_stress_test +
|
| owl:sameAs |
http://dbpedia.org/resource/Hardware_stress_test +
, http://www.wikidata.org/entity/Q10380935 +
, http://rdf.freebase.com/ns/m.0r8mk5b +
, http://pt.dbpedia.org/resource/Teste_de_massa +
, https://global.dbpedia.org/id/7fEx +
|
| rdfs:comment |
A stress test (sometimes called a torture … A stress test (sometimes called a torture test) of hardware is a form of deliberately intense and thorough testing used to determine the stability of a given system or entity. It involves testing beyond normal operational capacity, often to a breaking point, in order to observe the results. The term stress test as it relates to hardware (including electronics, physical devices, nuclear power plants, etc.) is likely to have different refined meanings in specific contexts. One example is in materials, see Fatigue (material).e is in materials, see Fatigue (material).
, Teste de massa é usado para verificar o li … Teste de massa é usado para verificar o limite de dados processados pelo software até que ele não consiga mais processa-lo. Também é conhecido como teste de estresse. Usado para validar e avaliar a aceitabilidade dos limites operacionais de um sistema de acordo com cargas de trabalho variáveis, ao passo que o sistema em teste permanece constante. Em geral, as medições são tomadas com base na taxa de transferência de dados da carga de trabalho e no tempo de resposta da transação alinhado.o tempo de resposta da transação alinhado.
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| rdfs:label |
Hardware stress test
, Teste de massa
|
