Browse Wiki & Semantic Web

Jump to: navigation, search
Http://dbpedia.org/resource/Flying probe
  This page has no properties.
hide properties that link here 
  No properties link to this page.
 
http://dbpedia.org/resource/Flying_probe
http://dbpedia.org/ontology/abstract In the manufacture of electronic printed cIn the manufacture of electronic printed circuit boards, flying probes are used for testing both bare circuit boards and boards loaded with components. Flying probes were introduced in the late 1980’s. Flying probes can be found in many manufacturing and assembly operations. A flying probe tester uses one or more test probes to make contact with the circuit board under test; the probes are moved from place to place on the circuit board to carry out tests of multiple conductors or components. Flying probe testers are an alternative to bed of nails testers, which use multiple contacts to simultaneously contact the board and which rely on electrical switching to carry out measurements. One limitation in flying probe test methods is the speed at which measurements can be taken; the probes must be moved to each new test site on the board, and then a measurement must be completed. Bed-of-nails testers touch each test point simultaneously and electronic switching of instruments between test pins is more rapid than movement of probes.ins is more rapid than movement of probes.
http://dbpedia.org/ontology/thumbnail http://commons.wikimedia.org/wiki/Special:FilePath/Flying_Probe.jpg?width=300 +
http://dbpedia.org/ontology/wikiPageExternalLink https://www.gardien.com/ +
http://dbpedia.org/ontology/wikiPageID 14326527
http://dbpedia.org/ontology/wikiPageLength 8221
http://dbpedia.org/ontology/wikiPageRevisionID 1099719468
http://dbpedia.org/ontology/wikiPageWikiLink http://dbpedia.org/resource/Integrated_circuit + , http://dbpedia.org/resource/Pogo_pin + , http://dbpedia.org/resource/Boundary_scan + , http://dbpedia.org/resource/Category:Nondestructive_testing + , http://dbpedia.org/resource/In-circuit_test + , http://dbpedia.org/resource/Category:Hardware_testing + , http://dbpedia.org/resource/File:Flying_Probe.jpg + , http://dbpedia.org/resource/Inductor + , http://dbpedia.org/resource/Power-off_testing + , http://dbpedia.org/resource/ATE_diagnostics + , http://dbpedia.org/resource/Computer-aided_design + , http://dbpedia.org/resource/Resistor + , http://dbpedia.org/resource/Automated_optical_inspection + , http://dbpedia.org/resource/Capacitor + , http://dbpedia.org/resource/Zener_diode + , http://dbpedia.org/resource/Analog_signature_analysis + , http://dbpedia.org/resource/Printed_circuit_board + , http://dbpedia.org/resource/Bed_of_nails_tester + , http://dbpedia.org/resource/Dielectric_withstand_test + , http://dbpedia.org/resource/Category:Electronic_test_equipment +
http://dbpedia.org/property/wikiPageUsesTemplate http://dbpedia.org/resource/Template:Reflist + , http://dbpedia.org/resource/Template:Short_description +
http://purl.org/dc/terms/subject http://dbpedia.org/resource/Category:Electronic_test_equipment + , http://dbpedia.org/resource/Category:Nondestructive_testing + , http://dbpedia.org/resource/Category:Hardware_testing +
http://www.w3.org/ns/prov#wasDerivedFrom http://en.wikipedia.org/wiki/Flying_probe?oldid=1099719468&ns=0 +
http://xmlns.com/foaf/0.1/depiction http://commons.wikimedia.org/wiki/Special:FilePath/Flying_Probe.jpg +
http://xmlns.com/foaf/0.1/isPrimaryTopicOf http://en.wikipedia.org/wiki/Flying_probe +
owl:sameAs http://www.wikidata.org/entity/Q5463595 + , http://dbpedia.org/resource/Flying_probe + , http://rdf.freebase.com/ns/m.03d0m3v + , https://global.dbpedia.org/id/4jkA4 +
rdfs:comment In the manufacture of electronic printed cIn the manufacture of electronic printed circuit boards, flying probes are used for testing both bare circuit boards and boards loaded with components. Flying probes were introduced in the late 1980’s. Flying probes can be found in many manufacturing and assembly operations. A flying probe tester uses one or more test probes to make contact with the circuit board under test; the probes are moved from place to place on the circuit board to carry out tests of multiple conductors or components. Flying probe testers are an alternative to bed of nails testers, which use multiple contacts to simultaneously contact the board and which rely on electrical switching to carry out measurements.rical switching to carry out measurements.
rdfs:label Flying probe
hide properties that link here 
http://dbpedia.org/resource/Fixtureless_in-circuit_test + , http://dbpedia.org/resource/Flying_Probe + , http://dbpedia.org/resource/Fixtureless_In-Circuit_Test + http://dbpedia.org/ontology/wikiPageRedirects
http://dbpedia.org/resource/Analog_signature_analysis + , http://dbpedia.org/resource/Fixtureless_in-circuit_test + , http://dbpedia.org/resource/Test_engineer + , http://dbpedia.org/resource/Automatic_test_equipment + , http://dbpedia.org/resource/Printed_circuit_board + , http://dbpedia.org/resource/In-circuit_testing + , http://dbpedia.org/resource/SPEA_%28company%29 + , http://dbpedia.org/resource/Flying_Probe + , http://dbpedia.org/resource/Fixtureless_In-Circuit_Test + , http://dbpedia.org/resource/FICT + http://dbpedia.org/ontology/wikiPageWikiLink
http://en.wikipedia.org/wiki/Flying_probe + http://xmlns.com/foaf/0.1/primaryTopic
http://dbpedia.org/resource/Flying_probe + owl:sameAs
 

 

Enter the name of the page to start semantic browsing from.