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http://dbpedia.org/ontology/abstract Field emission probes are used in scanningField emission probes are used in scanning electron microscopy for imaging. When a voltage is applied to these probes, electrons are emitted from the tips through a process known as field electron emission. When a body is subjected to in a vacuum, the geometry of the surface of the body is unknown. Upon further study, the field emission probes will be kept which will emit electrons as soon as a voltage is applied across them. As a result, this will cause the emission of secondary electrons from the surface of the body subjected to ion milling. By collecting these secondary emitted electrons, a clear image of the surface of the ion-milled body can be obtained. This technique is also used in scanning electron microscopes (SEM). There exist various well-defined techniques for preparing field emission probes. Ideally, a field emission probe should be extremely sharp, possibly terminating in a single atom. To resolve details at the atomic level, it should have a small aspect ratio to reduce mechanical vibration while scanning, a stable atomic configuration at its apex to yield reliable and reproducible images, and be clean enough to ensure a stable tunnel junction since the presence of contaminants like oxides or etching by-products could alter its metallic behavior. Despite the various well-known methods to make field emission probes, such as the Drop-off method, it is still difficult to get an ideal probe. is still difficult to get an ideal probe.
http://dbpedia.org/ontology/wikiPageID 23850454
http://dbpedia.org/ontology/wikiPageLength 2073
http://dbpedia.org/ontology/wikiPageRevisionID 1123637429
http://dbpedia.org/ontology/wikiPageWikiLink http://dbpedia.org/resource/Category:Microscopes + , http://dbpedia.org/resource/Electron_microscope + , http://dbpedia.org/resource/Field_electron_emission + , http://dbpedia.org/resource/Atom + , http://dbpedia.org/resource/Vacuum + , http://dbpedia.org/resource/Category:Microscopy + , http://dbpedia.org/resource/Scanning_tunneling_microscope + , http://dbpedia.org/resource/Ion + , http://dbpedia.org/resource/Field_emission + , http://dbpedia.org/resource/Voltage + , http://dbpedia.org/resource/Electron + , http://dbpedia.org/resource/Ion_milling + , http://dbpedia.org/resource/Scanning_electron_microscope +
http://dbpedia.org/property/wikiPageUsesTemplate http://dbpedia.org/resource/Template:Tone +
http://purl.org/dc/terms/subject http://dbpedia.org/resource/Category:Microscopy + , http://dbpedia.org/resource/Category:Microscopes +
http://www.w3.org/ns/prov#wasDerivedFrom http://en.wikipedia.org/wiki/Field_emission_probes?oldid=1123637429&ns=0 +
http://xmlns.com/foaf/0.1/isPrimaryTopicOf http://en.wikipedia.org/wiki/Field_emission_probes +
owl:sameAs https://global.dbpedia.org/id/4k6W6 + , http://rdf.freebase.com/ns/m.06_vxgz + , http://www.wikidata.org/entity/Q5446992 + , http://dbpedia.org/resource/Field_emission_probes + , http://yago-knowledge.org/resource/Field_emission_probes +
rdf:type http://dbpedia.org/class/yago/Artifact100021939 + , http://dbpedia.org/class/yago/Whole100003553 + , http://dbpedia.org/class/yago/Instrumentality103575240 + , http://dbpedia.org/class/yago/ScientificInstrument104147495 + , http://dbpedia.org/class/yago/Instrument103574816 + , http://dbpedia.org/class/yago/Device103183080 + , http://dbpedia.org/class/yago/Microscope103760671 + , http://dbpedia.org/class/yago/PhysicalEntity100001930 + , http://dbpedia.org/class/yago/WikicatMicroscopes + , http://dbpedia.org/class/yago/Magnifier103709206 + , http://dbpedia.org/class/yago/Object100002684 +
rdfs:comment Field emission probes are used in scanningField emission probes are used in scanning electron microscopy for imaging. When a voltage is applied to these probes, electrons are emitted from the tips through a process known as field electron emission. Despite the various well-known methods to make field emission probes, such as the Drop-off method, it is still difficult to get an ideal probe. is still difficult to get an ideal probe.
rdfs:label Field emission probes
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http://dbpedia.org/resource/Index_of_physics_articles_%28F%29 + , http://dbpedia.org/resource/Field_electron_emission + http://dbpedia.org/ontology/wikiPageWikiLink
http://en.wikipedia.org/wiki/Field_emission_probes + http://xmlns.com/foaf/0.1/primaryTopic
 

 

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