Browse Wiki & Semantic Web

Jump to: navigation, search
Http://dbpedia.org/resource/Category:Electron microscopy
  This page has no properties.
hide properties that link here 
  No properties link to this page.
 
http://dbpedia.org/resource/Category:Electron_microscopy
http://dbpedia.org/ontology/wikiPageID 23198183
http://dbpedia.org/ontology/wikiPageRevisionID 931278533
http://dbpedia.org/property/wikiPageUsesTemplate http://dbpedia.org/resource/Template:Cat_main + , http://dbpedia.org/resource/Template:Commons_category +
http://www.w3.org/2004/02/skos/core#broader http://dbpedia.org/resource/Category:Microscopy + , http://dbpedia.org/resource/Category:Electron +
http://www.w3.org/2004/02/skos/core#prefLabel Electron microscopy
http://www.w3.org/ns/prov#wasDerivedFrom http://en.wikipedia.org/wiki/Category:Electron_microscopy?oldid=931278533&ns=14 +
owl:sameAs http://dbpedia.org/resource/Category:Electron_microscopy +
rdf:type http://www.w3.org/2004/02/skos/core#Concept +
rdfs:label Electron microscopy
hide properties that link here 
http://dbpedia.org/resource/F._M._L._Sheffield + , http://dbpedia.org/resource/CrysTBox + , http://dbpedia.org/resource/Negative_stain + , http://dbpedia.org/resource/Dose-fractionation_theorem + , http://dbpedia.org/resource/Scanning_confocal_electron_microscopy + , http://dbpedia.org/resource/Liquid-Phase_Electron_Microscopy + , http://dbpedia.org/resource/Karnovsky_fixative + , http://dbpedia.org/resource/Dark-field_microscopy + , http://dbpedia.org/resource/Electron_channelling_contrast_imaging + , http://dbpedia.org/resource/Zone_axis + , http://dbpedia.org/resource/Electron_beam-induced_deposition + , http://dbpedia.org/resource/Ultrastructure + , http://dbpedia.org/resource/Auger_architectomics + , http://dbpedia.org/resource/Immune_electron_microscopy + , http://dbpedia.org/resource/Durcupan + , http://dbpedia.org/resource/Electron_microscope + , http://dbpedia.org/resource/Focused_ion_beam + , http://dbpedia.org/resource/In_situ_electron_microscopy + , http://dbpedia.org/resource/Wien_filter + , http://dbpedia.org/resource/Crowther_criterion + , http://dbpedia.org/resource/Multiscale_tomography + , http://dbpedia.org/resource/Microcrystal_electron_diffraction + , http://dbpedia.org/resource/Ion_milling_machine + , http://dbpedia.org/resource/Satyavati_Motiram_Sirsat + , http://dbpedia.org/resource/Annular_dark-field_imaging + , http://dbpedia.org/resource/Kikuchi_lines_%28physics%29 + , http://dbpedia.org/resource/EM_Data_Bank + , http://dbpedia.org/resource/Transmission_electron_microscopy_DNA_sequencing + , http://dbpedia.org/resource/List_of_microscopy_visualization_systems + , http://dbpedia.org/resource/Serial_block-face_scanning_electron_microscopy + , http://dbpedia.org/resource/Orbital_angular_momentum_of_free_electrons + , http://dbpedia.org/resource/Low-voltage_electron_microscope + , http://dbpedia.org/resource/Selected_area_diffraction + , http://dbpedia.org/resource/Transmission_electron_cryomicroscopy + , http://dbpedia.org/resource/Correlative_light-electron_microscopy + , http://dbpedia.org/resource/Electron_tomography + , http://dbpedia.org/resource/Detectors_for_transmission_electron_microscopy + , http://dbpedia.org/resource/Scanning_electron_cryomicroscopy + , http://dbpedia.org/resource/Transport-of-intensity_equation + , http://dbpedia.org/resource/Transmission_Electron_Aberration-Corrected_Microscope + , http://dbpedia.org/resource/Ultramicrotomy + , http://dbpedia.org/resource/Lucy_Collinson + , http://dbpedia.org/resource/Geometric_phase_analysis + , http://dbpedia.org/resource/Direct_methods_%28electron_microscopy%29 + , http://dbpedia.org/resource/Stigmator + , http://dbpedia.org/resource/Austrian_Centre_for_Electron_Microscopy_and_Nanoanalysis + , http://dbpedia.org/resource/Charge_contrast_imaging + , http://dbpedia.org/resource/Scherzer%27s_theorem + , http://dbpedia.org/resource/Photoemission_electron_microscopy + , http://dbpedia.org/resource/Fluctuation_electron_microscopy + http://dbpedia.org/ontology/wikiPageWikiLink
http://dbpedia.org/resource/F._M._L._Sheffield + , http://dbpedia.org/resource/CrysTBox + , http://dbpedia.org/resource/Negative_stain + , http://dbpedia.org/resource/Dose-fractionation_theorem + , http://dbpedia.org/resource/Scanning_confocal_electron_microscopy + , http://dbpedia.org/resource/Liquid-Phase_Electron_Microscopy + , http://dbpedia.org/resource/Karnovsky_fixative + , http://dbpedia.org/resource/Dark-field_microscopy + , http://dbpedia.org/resource/Electron_channelling_contrast_imaging + , http://dbpedia.org/resource/Zone_axis + , http://dbpedia.org/resource/Electron_beam-induced_deposition + , http://dbpedia.org/resource/Ultrastructure + , http://dbpedia.org/resource/Auger_architectomics + , http://dbpedia.org/resource/Immune_electron_microscopy + , http://dbpedia.org/resource/Durcupan + , http://dbpedia.org/resource/Electron_microscope + , http://dbpedia.org/resource/Focused_ion_beam + , http://dbpedia.org/resource/In_situ_electron_microscopy + , http://dbpedia.org/resource/Wien_filter + , http://dbpedia.org/resource/Crowther_criterion + , http://dbpedia.org/resource/Multiscale_tomography + , http://dbpedia.org/resource/Microcrystal_electron_diffraction + , http://dbpedia.org/resource/Ion_milling_machine + , http://dbpedia.org/resource/Satyavati_Motiram_Sirsat + , http://dbpedia.org/resource/Annular_dark-field_imaging + , http://dbpedia.org/resource/Kikuchi_lines_%28physics%29 + , http://dbpedia.org/resource/EM_Data_Bank + , http://dbpedia.org/resource/Transmission_electron_microscopy_DNA_sequencing + , http://dbpedia.org/resource/List_of_microscopy_visualization_systems + , http://dbpedia.org/resource/Serial_block-face_scanning_electron_microscopy + , http://dbpedia.org/resource/Orbital_angular_momentum_of_free_electrons + , http://dbpedia.org/resource/Low-voltage_electron_microscope + , http://dbpedia.org/resource/Selected_area_diffraction + , http://dbpedia.org/resource/Transmission_electron_cryomicroscopy + , http://dbpedia.org/resource/Correlative_light-electron_microscopy + , http://dbpedia.org/resource/Electron_tomography + , http://dbpedia.org/resource/Detectors_for_transmission_electron_microscopy + , http://dbpedia.org/resource/Scanning_electron_cryomicroscopy + , http://dbpedia.org/resource/Transport-of-intensity_equation + , http://dbpedia.org/resource/Transmission_Electron_Aberration-Corrected_Microscope + , http://dbpedia.org/resource/Ultramicrotomy + , http://dbpedia.org/resource/Lucy_Collinson + , http://dbpedia.org/resource/Geometric_phase_analysis + , http://dbpedia.org/resource/Direct_methods_%28electron_microscopy%29 + , http://dbpedia.org/resource/Stigmator + , http://dbpedia.org/resource/Austrian_Centre_for_Electron_Microscopy_and_Nanoanalysis + , http://dbpedia.org/resource/Charge_contrast_imaging + , http://dbpedia.org/resource/Scherzer%27s_theorem + , http://dbpedia.org/resource/Photoemission_electron_microscopy + , http://dbpedia.org/resource/Fluctuation_electron_microscopy + , http://dbpedia.org/resource/Ronchigram + http://purl.org/dc/terms/subject
http://dbpedia.org/resource/Category:Electron_microscopy_techniques + , http://dbpedia.org/resource/Category:Electron_microscopy_stains + http://www.w3.org/2004/02/skos/core#broader
http://dbpedia.org/resource/Category:Electron_microscopy + owl:sameAs
 

 

Enter the name of the page to start semantic browsing from.
Retrieved from "http://www.b-kaempgen.de/index.php/Special:BrowseSW/http:-2F-2Fdbpedia.org-2Fresource-2FCategory:Electron_microscopy"