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Atomic force acoustic microscopy (AFAM) is … Atomic force acoustic microscopy (AFAM) is a type of scanning probe microscopy (SPM). It is a combination of acoustics and atomic force microscopy. The principal difference between AFAM and other forms of SPM is the addition of a transducer at the bottom of the sample which induces longitudinal out-of-plane vibrations in the specimen. These vibrations are sensed by a cantilever and tip called a probe. The figure shown here is the clear schematic of AFAM principle here B is the magnified version of the tip and sample placed on the transducer and tip having some optical coating generally gold coating to reflect the laser light on to the photodiode. Any type of material can be measured with this microscope. In particular, Nano-scale properties such as elastic modulus, shear modulus and Poisson ratio can be measured. The frequency used sweeps from some few kHz to MHz, keeping the sine wave amplitude constant. The sine longitudinal waves are sensed by the probe, and the deflection of the probe is detected by laser light focused on to a position sensitive photodiode (PSPD). This deflection of the reflected laser beam from the cantilever (probe) indicates the flexural and torsional parameters of the specimen. The high-frequency signal is sent to a lock-in amplifier and correlated with the reference signal sent by the signal generator to form the AFAM image. Since the development of atomic force microscopy many modes and related techniques have emerged. Ultrasonic force microscopy, ultrasonic atomic force microscopy, scanning acoustic force microscopy and AFAM all come under the branch of near-field microscopy techniques called contact resonance force microscopy (CRFM). CRFM techniques depend principally on the calculation of contact resonance frequencies and how they shift with variations (like precipitates and matrix) in the sample.ke precipitates and matrix) in the sample.
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Atomic force acoustic microscopy (AFAM) is … Atomic force acoustic microscopy (AFAM) is a type of scanning probe microscopy (SPM). It is a combination of acoustics and atomic force microscopy. The principal difference between AFAM and other forms of SPM is the addition of a transducer at the bottom of the sample which induces longitudinal out-of-plane vibrations in the specimen. These vibrations are sensed by a cantilever and tip called a probe. The figure shown here is the clear schematic of AFAM principle here B is the magnified version of the tip and sample placed on the transducer and tip having some optical coating generally gold coating to reflect the laser light on to the photodiode.lect the laser light on to the photodiode.
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Atomic force acoustic microscopy
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